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2016.06.07

Naujas metodas ir masių spektrometro dizainas TOF-SIMS paralelinio MS/MS atvaizdavimui

Biologai iki šių dienų nenaudodavo TOF-SIMS sistemos analizėms, bet dėka naujo metodo (paralelinis MS/MS) molekulių paviršiaus analizė ir molekulių identifikavimas nanometro skalėje tapo įmanomas su TOF-SIMS sistema.

Norime pasidalinti naujausiu straipsniu „A New Method and Mass Spectrometer Design for TOF-SIMS Parallel Imaging MS/MS“ tarptautiniame žurnale – „Analytical Chemistry“ (anglų k.):

Santrauka. We report a method for the unambiguous identification of molecules in biological and materials specimens at high practical lateral resolution using a new TOF-SIMS parallel imaging MS/MS spectrometer. The tandem mass spectrometry imaging reported here is based on the precise monoisotopic selection of precursor ions from a TOF-SIMS secondary ion stream followed by the parallel and synchronous collection of the product ion data. Thus, our new method enables simultaneous surface screening of a complex matrix chemistry with TOF-SIMS (MS1) imaging and targeted identification of matrix components with MS/MS (MS2) imaging. This approach takes optimal advantage of all ions produced from a multicomponent sample, compared to classical tandem mass spectrometric methods that discard all ions with the exception of specific ions of interest. We have applied this approach for molecular surface analysis and molecular identification on the nanometer scale. High abundance sensitivity is achieved at low primary ion dose density; therefore, one-of-a-kind samples may be relentlessly probed before ion-beam-induced molecular damage is observed.

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Daugiau apie TOF-SIMS tiekėjo puslapyje čia.  

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info@inospectra.com

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Breslaujos g. 3b, LT-44403 Kaunas