Description
We offer the M-2000® line of spectroscopic ellipsometers to meet a wide range of thin-film characteristics. M-2000® ellipsometers are designed for surface analysis of thin films or multilayer structures. The ellipsometer can also determine the roughness, thickness (depth), crystalline structure, doping concentration, electrical conductivity, and other properties of the test substance. The potent and versatile tool integrates advanced optical design, wide spectral range, and fast data acquisition to deliver flawless speed and accuracy effectively.
The M-2000® is the first ellipsometer to measure all wavelengths simultaneously, i.e., more than 700 wavelengths from ultraviolet to near-infrared. Its advanced, patented RCE (rotating compensator) technology for the highest accuracy and precision is unrivaled. The modular optical design integrated into the ellipsometer allows the device to be easily attached to a process chamber or countertop.
Contact our product specialists who will deliver and help you choose the most suitable ellipsometer for your laboratory.
