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Parallel Imaging MS/MS Mass Spectrometer - Inospectra
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Home Analytical Equipment Parallel Imaging MS/MS Mass Spectrometer
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Mass Spectrometers
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Analytical Process Measuring and Control Equipment
Analytical Process Measuring and Control Equipment
PHI nanoTOF 3 SIMS Spectrometer
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Physical Electronics

Parallel Imaging MS/MS Mass Spectrometer

We offer powerful and easy-to-use surface analysis spectrometers that provide unequalled performance in analyzing various samples with different textures, curvature or roughness. Thanks to the unique patented technology, you can identify the composition of any organic, inorganic, metal-organic or mineral ions and the structural information of organic and biological molecules.

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Description

Description

We suggest choosing the patented Parallel Imaging MS/MS Time of Flight Secondary Ion Mass Spectrometer PHI nanoTOF 3. The high-sensitivity device ensures highly accurate results. This spectrometer features low spectral background, the ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous peak identification with parallel tandem MS imaging capability. Depending on requirements, the PHI nanoTOF 3 SIMS spectrometer can be configured with various options to optimize performance for organic, inorganic, or both materials.

For more information on surface analysis spectrometers, contact our product specialists, who will answer all your questions and suggest the best equipment.

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PHI nanoTOF 3 SIMS Spectrometer
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Physical Electronics

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