We recommend selecting the patented Parallel Imaging MS/MS Time-of-Flight Secondary Ion Mass Spectrometer, PHI nanoTOF 3. The high-sensitivity device ensures highly accurate results. This spectrometer features a low spectral background, the ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous peak identification, along with parallel tandem MS imaging capability. Depending on requirements, the PHI nanoTOF 3 SIMS spectrometer can be configured with various options to optimise performance for organic, inorganic, or both materials.

For more information on surface analysis spectrometers, please contact our product specialists, who will be pleased to answer all your questions and recommend the best equipment for your needs.