We suggest choosing the patented Parallel Imaging MS/MS Time of Flight Secondary Ion Mass Spectrometer PHI nanoTOF 3. The high-sensitivity device ensures highly accurate results. This spectrometer features low spectral background, the ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous peak identification with parallel tandem MS imaging capability. Depending on requirements, the PHI nanoTOF 3 SIMS spectrometer can be configured with various options to optimize performance for organic, inorganic, or both materials.
For more information on surface analysis spectrometers, contact our product specialists, who will answer all your questions and suggest the best equipment.